Class [9]
Computer & Software Products & Electrical & Scientific Products
Scientific, industrial, electric, electronic, optic and optoelectronic apparatus and instruments (included in this class), in particular lasers and parts thereof, laser apparatus, laser diagnostic apparatus, apparatus for the measurement of optical radiation, optoelectronic measuring and evaluation apparatus, optoelectronic apparatus and instruments for sensory analysis, optoelectronic analysis apparatus, optoelectronic apparatus and instruments for analysis, optic, optoelectronic and electronic test apparatus particularly for semiconductor technology, and vibrometers, in particular laser-vibrometers; components of the above listed goods (included in this class), in particular power measuring instruments and energy measuring instruments, modulators, rotators, cameras, detector arrays and IR visual apparatus (for laser diagnostic systems); radiometers, photometers, light measuring instruments, dosimeters, spectroradiometers, colour-measuring instruments, VIS and IR cameras, solar simulators, power supplies, monochromators, spectrographs, black body radiators and collimators (for the measurement of optical radiation); laser vibrometers, interferometers, laser velocimeters, IR cameras, temperature measuring instruments by fiber optics and sensors for measuring the field intensity of mirowaves by fiber optics (for sensory analysis); spectrometers, photometers and spectrophotometers (for analysis); photodetectors, IR detectors, detector array apparatus, stroboscopes, stricks of fibers and swan necks, ring lights by fiber optics, line lights and illuminating areas; beam waveguides, laser diode modules, transmitting-receiving components for beam waveguides, splicing apparatus for beam waveguides (included in this class), data link systems by beam waveguides; electronic control systems for lamps; electronic image-analyzing systems and components for image detecting equipment (included in this class); software, in particular for detecting of defects by noise analysis.
