Class [9]
Computer & Software Products & Electrical & Scientific Products
Scientific, measuring and detecting apparatus and instruments, including spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; X-ray detecting apparatus and instruments; X-ray measuring, detecting and monitoring instruments, indicators and controllers; X-ray detectors; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, including X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes; materials characterization apparatus, including scientific and measuring apparatus and instruments, including spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus not for medical use; analytical, process control and measuring apparatus, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for the cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; X-ray fluorescence wafer and disc analysers [and automated ellipsometers]; X-ray fluorescence wafer and disc analysers [and automated ellipsometers] for the silicon semiconductor industry, for analysing film thickness, composition and density; diffraction apparatus [microscopy]; diffraction apparatus and instruments; X-ray diffraction instruments, including X-ray diffraction meters for the compound semiconductor industry; X-ray tubes, not for medical purposes; computer software; computer software for use in relation to spectrometry; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to X-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to X-ray apparatus not for medical use; parts and fittings for all the aforesaid goods.
